Triviality metric for high-throughput detection of topological flat band materials

Anupam Bhattacharya, Henry Kelbrick Pentz, Thomas Warford, Artem Mishchenko

Published: 21 Apr 2025, Last Modified: 21 Apr 2025AI4X 2025 OralEveryoneRevisionsBibTeXCC BY 4.0
Keywords: AI for flat bands, High throughput calculations, DFT
TL;DR: A methodology for high throughput detection of non-trivial flat bands which can lead to superconductivity, within the vast space of AI identified flat bands.
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Submission Number: 162

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