Deep learning STEM-EDX tomography of nanocrystals

Yoseob Han, Jaeduck Jang, Eunju Cha, Junho Lee, Hyungjin Chung, Myoungho Jeong, Tae-Gon Kim, Byeong Gyu Chae, Hee Goo Kim, Shinae Jun, Sungwoo Hwang, Eunha Lee, Jong Chul Ye

Abstract: Advanced electron microscopy and spectroscopy techniques can reveal useful structural and chemical details at the nanoscale. An unsupervised deep learning approach helps to reconstruct 3D images and observe the relationship between optical and structural properties of semiconductor nanocrystals, of interest in optoelectronic applications.