Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators

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Wen Li, Ying Wang, Huawei Li, Xiaowei Li, Kaiwei Zou

Published: 2025, Last Modified: 28 May 2026IEEE Des. Test 2025EveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Editor’s notes: This article offers an overview of the RRAMedy framework, designed to perform online testing, fault diagnosis, and fault mitigation in resistive random-access memory (ReRAM) devices, specifically in the context of ReRAM crossbar-based implementations for AI hardware acceleration. —Jyotika Athavale, Synopsys, USA —Haralampos-G. Stratigopoulos, Sorbonne Université, CNRS, LIP6, France