HighTPI: A Hierarchical Graph Based Intelligent Method for Test Point Insertion

Zhiteng Chao, Bin Sun, Hongqin Lyu, Ge Yu, Minjun Wang, Wenxing Li, Zizhen Liu, Jianan Mu, Shengwen Liang, Jing Ye, Xiaowei Li, Huawei Li

Abstract: As integrated circuits grow in complexity, test point insertion (TPI) has become vital for enhancing testability and improving reliability in design for test (DFT). Recent studies have shown the effectiveness of deep learning-based TPI using graph neural networks (GNNs) in improving test quality. However, the high cost of collecting training data, incomplete capture of the intrinsic characteristics of circuits, and the vast search space in large circuits hinder the performance of existing intelligent approaches. This paper introduces HighTPI, a two-stage learning approach for TPI to effectively reduce the number of test patterns, which leverages hierarchical graph representation by constructing a hypergraph based on hypernodes in fanout-free regions (FFRs). HighTPI better captures multi-fanout reconvergence information while lowering the cost of obtaining ground-truth labels due to the smaller scale of the FFR-based hypergraph. Two specialized GNNs are designed in stage I to select candidate insertion points for observation and control points, respectively. This integration of expert knowledge through supervised learning helps guide the reinforcement learning process in stage II, mitigating the challenges of sparse rewards and a large decision space. The experimental results demonstrate that HighTPI outperforms other TPI methods in terms of the trade-off between pattern reduction and fault coverage enhancement.

External IDs:dblp:conf/vts/ChaoSLYWLLML0LL25