Multi-scale representation attention based deep multiple instance learning for gigapixel whole slide image analysis
Abstract: Highlights•We propose a novel end-to-end interpretable deep MIL framework to extract all patch-level features of each WSI.•Our framework is to directly solve the weakly supervised gigapixel WSI classification problem.•We propose a multi-scale representation attention mechanism to simultaneously mine the significant bag-, patch- and cell-level images for WSI analysis.
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