Using noise resilience for ranking generalization of deep neural networks

Depen Morwani, Rahul Vashisht, Harish G. Ramaswamy

Abstract: Recent papers have shown that sufficiently overparameterized neural networks can perfectly fit even random labels. Thus, it is crucial to understand the underlying reason behind the generalization performance of a network on real-world data. In this work, we propose several measures to predict the generalization error of a network given the training data and its parameters. Using one of these measures, based on noise resilience of the network, we secured 5th position in the predicting generalization in deep learning (PGDL) competition at NeurIPS 2020.