Statistical analysis of the impact of refinishing process on leaded components

Open Webpage

Chunyan Yin, Chris Best, Chris Bailey, Stoyan Stoyanov

Published: 01 Jan 2015, Last Modified: 15 May 2025Microelectron. Reliab. 2015EveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Highlights•Electrical test was carried out on both refinished and not refinished samples.•Statistical methods were used to analyze the electrical test data.•The refinishing process did not have significant impact on the tested components.•Refinished samples showed no signs of delamination in the CSAM testing.