Information-theoretic atomic representation for robust pattern classification

Yulong Wang, Yuan Yan Tang, Luoqing Li, Patrick Shen-Pei Wang

Abstract: Representation-based classifiers (RCs) including sparse RC (SRC) have attracted intensive interest in pattern recognition in recent years. In our previous work, we have proposed a general framework called atomic representation-based classifier (ARC) including many popular RCs as special cases. Despite the empirical success, ARC and conventional RCs utilize the mean square error (MSE) criterion and assign the same weights to all entries of the test data, including both severely corrupted and clean ones. This makes ARC sensitive to the entries with large noise and outliers. In this work, we propose an information-theoretic ARC (ITARC) framework to alleviate such limitation of ARC. Using ITARC as a general platform, we develop three novel representation-based classifiers. The experiments on public real-world datasets demonstrate the efficacy of ITARC for robust pattern recognition.