Photometric constraint for absolute phase unwrapping from single-frequency fringe patterns

Zhaoshuai Qi, Xiaojun Liu, Zhao Wang, Jiaqi Yang, Yanning Zhang

Abstract: Inter-reflection removal is vital for complex-scene reconstruction. However, most methods assume that the tested surface is a diffuse, and are limited to removal of inter-reflection caused only by diffuse reflections. For all kinds of inter-reflections caused by diffuse and specular reflections, a micro-frequency shifting (MFS) projection technique is presented. Because the modulation variation with frequency in inter-reflection regions is larger than that of other regions, we use the MFS technique to detect inter-reflections, where patterns with specifically designed frequency-shifts and base frequencies are projected. Inter-reflections are detected through large variations in modulation, and removed using a regional-projection technique. Experimental results validate the effectiveness for diffuse and specular inter-reflection removal.