Tunnel FET technology: A reliability perspective

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Suman Datta, Huichu Liu, Vijaykrishnan Narayanan

Published: 2014, Last Modified: 13 Nov 2024Microelectron. Reliab. 2014EveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Highlights•We present a review on TFET technology development for energy efficient computing.•A Verilog-A model based simulation framework is developed for TFET circuit design.•III–V HTFET exhibits superior soft-error performance for low power application.•Electrical noise characteristics of HTFET are investigated using analytical models.•The impact of process variation on HTFET SRAM performance is investigated.