From-the-EiC_38_1Download PDFOpen Website

Published: 2021, Last Modified: 16 May 2023IEEE Des. Test 2021Readers: Everyone
Abstract: fig orientation="portrait" position="float" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <graphic orientation="portrait" position="float" xlink:href="henke-3060957.tif"/> </fig> <bold xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">This issue is</b> dedicated to the annual Hack@DAC competition, an event that has been annually held at the Design Automation Conference (DAC) since 2017. The best scoring teams of this security competition were invited to write articles for this <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">IEEE Design&amp;Test</i> special issue. Many thanks to the guest editors Siddharth Garg, Daniel Holcomb, Jeyavijayan Rajendran, and Ahmad-Reza Sadeghi who are presenting four articles.
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