Maximizing Reliability in WDM Networks through Lightpath Routing

Hyang-Won Lee, Kayi Lee, Eytan H. Modiano

Abstract: We study the reliability maximization problem in WDM networks with random link failures. Reliability in these networks is defined as the probability that the logical network is connected, and it is determined by the underlying lightpath routing and the link failure probability. We show that in general the optimal lightpath routing depends on the link failure probability, and characterize the properties of lightpath routings that maximize the reliability in different failure probability regimes. In particular, we show that in the low failure probability regime, maximizing the ``cross-layer" min cut of the (layered) network maximizes reliability, whereas in the high failure probability regime, minimizing the spanning tree of the network maximizes reliability. Motivated by these results, we develop lightpath routing algorithms for reliability maximization.