BISTing Datapaths under Heterogeneous Test Schemes

David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre

Abstract: In this paper, we present a fast and efficient algorithm for BISTing datapaths described at the Register Transfer (RT) level. This algorithm is parameterized by user defined tuning factors allowing tradeoffs between fault coverage, area overhead and test application time. This algorithm is generic in the sense it handle and mixes heterogeneous test pattern generators and compactors.