Hierarchical damage correlations for old photo restoration

Weiwei Cai, Xuemiao Xu, Jiajia Xu, Huaidong Zhang, Haoxin Yang, Kun Zhang, Shengfeng He

Abstract: Highlights•We propose a unified framework consisting of two key components: ScratchNet and PatchNet.•ScratchNet employs a parallel Multi-scale Partial Convolution Module.•PatchNet incorporates the Non-local Inpainting Attention Module and Mask-aware Instance Norm Module.•Extensive experiments demonstrate the superiority of our method over state-of-the-art approaches.