Line-edge extraction based on E-spline acquisition model and a fast optimization algorithm

Akira Hirabayashi, Pier Luigi Dragotti

Abstract: We propose a line-edge extraction algorithm that uses an E-spline data acquisition model and a fast optimization algorithm. The proposed method can retrieve line-edge parameters, including orientation, offset, and amplitude at sub-pixel accuracy almost independently of the resolution of the images. Because of the optimization approach, the proposed method is robust against model mismatch such as noise, point spread function (PSF) model mismatch, or step line-edge assumption. These properties are verified by simulations using images taken with a digital SLR camera.