Attacking NIST biometric image software using nonlinear optimizationOpen Website

Sunny Raj, Jodh S. Pannu, Steven Lawrence Fernandes, Arvind Ramanathan, Laura L. Pullum, Sumit Kumar Jha

Published: 01 Jan 2020, Last Modified: 12 May 2023Pattern Recognit. Lett. 2020Readers: Everyone
0 Replies

OpenReview is a long-term project to advance science through improved peer review with legal nonprofit status. We gratefully acknowledge the support of the OpenReview Sponsors. © 2025 OpenReview