Attacking NIST biometric image software using nonlinear optimizationOpen Website

Sunny Raj, Jodh S. Pannu, Steven Lawrence Fernandes, Arvind Ramanathan, Laura L. Pullum, Sumit Kumar Jha

Published: 01 Jan 2020, Last Modified: 12 May 2023Pattern Recognit. Lett. 2020Readers: Everyone
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