Preface

Gennady L. Andrienko, Shixia Liu, John T. Stasko, Niklas Elmqvist, Bongshin Lee, Kwan-Liu Ma, James P. Ahrens, Robert M. Kirby, Jos B. T. M. Roerdink

Abstract: The papers in this special issue were presented at IEEE VIS 2016, held during October 23-28, 2016 in Baltimore, MD. VIS contains three conferences, held concurrently: the IEEE Visual Analytics Science and Technology Conference (IEEE VAST 2016), the IEEE Information Visualization Conference (IEEE InfoVis 2016), and the IEEE Scientific Visualization Conference (IEEE SciVis2016).