On Backside Probing Techniques and Their Emerging Security Threats

Liton Kumar Biswas, Leonidas Lavdas, M. Tanjidur Rahman, Mark M. Tehranipoor, Navid Asadizanjani

Abstract: Various probing methodologies have been developed in the semiconductor industry to perform failure analysis of an integrated circuit. However, these probing techniques can be misused to launch security attacks and extract sensitive information from the hardware. In this article, the authors provide an overview of such attacks and present probable countermeasures and their limitations.