Probabilistic deep metric learning for hyperspectral image classification

Chengkun Wang, Wenzhao Zheng, Xian Sun, Jie Zhou, Jiwen Lu

Abstract: Highlights•We adopt probabilistic embedding to consider both spectral and label uncertainty.•We generate samples by Monte Carlo sampling and impose a DML loss for optimization.•We conduct experiments on 4 widely used datasets and achieve the state-of-the-art.