Identifying well-oriented diffraction patterns in XFEL datasets

David H. Wojtas, Carolin Seuring, Kartik Ayyer, Henry N. Chapman, Rick P. Millane

Abstract: The application of newly developed imaging techniques using X-ray Free Electron Laser (XFEL) sources requires equally new methods for analysing the large volumes of data collected. Methods are described for processing and assessing the quality of the measured XFEL diffraction patterns. The methods are applied to an XFEL data-set to extract diffraction patterns that show strong molecular alignment.