Real-time recognition system of soybean seed full-surface defects based on deep learning

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Guoyang Zhao, Longzhe Quan, Hailong Li, Huaiqu Feng, Songwei Li, Shuhan Zhang, Ruiqi Liu

Published: 2021, Last Modified: 15 Jan 2026Comput. Electron. Agric. 2021EveryoneRevisionsBibTeXCC BY-SA 4.0