Defect Detection and Localization using 2D Slicing Method on 3D X-ray Microscopy

Aye Phyu Phyu Aung, Zhuoyi Lin, Ramanpreet Singh Pahwa, Riko I Made, Senthilnath Jayavelu

Keywords: 3D-XRM, Random Forest, Faster R-CNN, Defect Detection, Defect Localization

TL;DR: We propose a two-step machine learning model that performs both defect detection of the sample as either defective or non-defective, and defect localization, pinpointing the failure region within the sample.

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Submission Number: 130