SEEN: Few-Shot Classification with SElf-ENsemble

Weisen Jiang, Yu Zhang, James T. Kwok

Abstract: Few-shot classification aims at learning new concepts with only a few labeled examples. In this paper, we focus on metric-based methods that have achieved state-of-the-art performance. However, they classify query examples based on embeddings extracted from only the last layer. These embeddings tend to be class-specific and may not generalize well to novel classes or domains. To alleviate this problem, we propose the SElf-ENsemble (SEEN) that leverages embeddings from multiple layers. Specifically, a base classifier is built for each of the last few layers, and the resultant base classifiers are then combined together. Experiments on various benchmark datasets demonstrate that the proposed SEEN method outperforms existing methods in both standard few-shot classification and cross-domain few-shot classification scenarios.