Stitching Grid-wise Atomic Force Microscope Images

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Mathias Zacho Vestergaard, Stefan Hein Bengtson, Malte Pedersen, Christian Rankl, Thomas B. Moeslund

Published: 01 Jan 2016, Last Modified: 27 Feb 2026Proceedings of the 11th Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications - Volume 3: VISAPPEveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Atomic Force Microscopes (AFM) are able to capture images with a resolution in the nano metre scale. Due to this high resolution, the covered area per image is relatively small, which can be problematic when surveying a sample. A system able to stitch AFM images has been developed to solve this problem. The images exhibit tilt, offset and scanner bow, which are counteracted by subtracting a polynomial from each line. To be able to stitch the images properly template selection is done by analyzing texture and using a voting scheme. Grids of 3x3 images have been successfully leveled and stitched.