Statistical design and optimization of SRAM cell for yield enhancement

Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaushik Roy

Abstract: We have analyzed and modeled the failure probabilities of SRAM cells due to process parameter variations. A method to predict the yield of a memory chip based on the cell failure probability is proposed. The developed method is used in an early stage of a design cycle to minimize memory failure probability by statistically sizing of SRAM cell.