Abnormal Detection of Commutator Surface Defects Based on YOLOv8

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ZhiYuan Li, Ban-Hoe Kwan, Mau-Luen Tham, Oon-Ee Ng, Patrick Shen-Pei Wang

Published: 2024, Last Modified: 28 May 2026Int. J. Pattern Recognit. Artif. Intell. 2024EveryoneRevisionsBibTeXCC BY-SA 4.0