The impact of the measurement accuracy and the excitation pattern on EIT image reconstruction

Shu Zhao, Juan Deng, Hong Sha, Yan Wang, Chaoshi Ren

Abstract: The prediction of the image quality of a practical electrical impedance tomography (EIT) system is challenging. The reconstructed image quality of a practical EIT system with different measurement accuracy and under different excitation patterns for the object at different positions have been studied. The results show that a practical EIT system with limited accuracy is often deficient in the data distinction and the tiny difference of boundary voltages cannot be detected. Sequentially different system accuracy and excitation patterns make different impacts on the image reconstruction. The method in this study will be useful in the image quality prediction of a practical EIT system.