Abstract: This paper presents a computer vision system for biscuit defects inspection which contains both hardware and software. By utilizing the system with two cameras, we focus on the detection of biscuit partial deletion and cream overflow. For detecting partial deletion, a new algorithm with a membership function for calculating feature descriptor is proposed. It’s convenient and efficient to extract feature of textons. For cream overflow detection, a chemical property of enantiomers under polarized light is made use of distinguishing cream from background. The proposed system has been implemented on the production line. Groups of on-line experiments show that our system can achieve accurate defect detection with low missing detection rate and false alarm.
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