Stress Testing for Resilience of Semiconductor Supply Chains

Zachary A. Collier, Davis C. Loose, Elvie Sellers, Thomas L. Polmateer, Madhur Behl, Igor Linkov, James H. Lambert

Abstract: Ubiquitous computing relies on a seamless integration of semiconductors. However, the supply chains of semiconductors and integrated devices are experiencing a variety of stressors and disruptions, with effects that cascade across the global economy. Understanding how stressors influence supply chain performance is urgent to avoid schedule delays, product shortages and enterprise losses. Stress testing is a collection of principles and methods for assessing the impact of risk scenarios on supply chain performance metrics and for characterizing system resilience. This paper introduces and demonstrates a framework that utilizes discrete event simulation in stress testing of the resilience of a semiconductor supply chain. The results include a comparison of resilience curves with and without risk countermeasures. This paper also discusses the potential impact of supply chain disruptions on the timely delivery and performance of ubiquitous devices and systems in the context of latest world events.