Domain-knowledge-informed functional outlier detection for line quality control systems

Jong Hwan Mun, Jitae Yoo, Heesun Kim, Nayi Ryu, Sungil Kim

Abstract: Highlights•Introducing the problem of detecting latent defects in modern manufacturing systems.•Demonstrating difficulties in detecting latent defects.•Proposing an approach that leverages domain knowledge for the detection of latent defects.•Developing new sequential transformation functions informed by domain knowledge.