Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules

Mahera Musallam, Chunyan Yin, Chris Bailey, C. Mark Johnson

Abstract: Highlights•A reduced-order thermal model coupled with physics-of-failure-based life models.•Study of effects of power and thermal cycling on two main failure mechanisms.•Identify the dominant wear-out mechanism with minimum elapsed time.•Appropriate reliability assessment to predict lifetime under in-service conditions.•Important method for design and qualification tests of power electronic modules.