A Miss Is as Good as A Mile: Metamorphic Testing for Deep Learning Operators

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Jinyin Chen, Chengyu Jia, Yunjie Yan, Jie Ge, Haibin Zheng, Yao Cheng

Published: 2024, Last Modified: 28 Feb 2026Proc. ACM Softw. Eng. 2024EveryoneRevisionsBibTeXCC BY-SA 4.0