Reliability assessment of FreeRTOS in Embedded Systems

Alberto Bosio, Maurizio Rebaudengo, Alessandro Savino

Abstract: This work studies the reliability of a FreeRTOS operating system when affected by Single Event Upset faults. The methodology is based on fault injection to target the most relevant variables and data structures. Results confirm the selectivity in the OS fault tolerance, paving the way to a tailored design of fault-tolerant mechanisms, such as selective hardening of the OS.