Deep Topological Denoising: Autoencoder-Driven Noise Suppression for Atomic Force Microscopy data with Topological Data Analysis Validation

Aleksandr S. Aglikov, Alexey V. Redkov, Timur A. Aliev, Michael Nosonovsky, Ekaterina V. Skorb

Keywords: atomic-force microscopy, autoencoder, denoising, topological data analysis

TL;DR: A novel framework combining autoencoder denoising with topological data analysis enhances surface characterization (AFM) by reducing noise while preserving critical structural features outperforming traditional methods.

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Submission Number: 198