Soft Error Resilience Analysis of LSTM Networks

Christopher P. Vasquez, Travis LeCompte, Xu Yuan, Nian-Feng Tzeng, Lu Peng

Abstract: Long Short-Term Memory (LSTM) deep neural networks are diverse in the tasks they can accomplish, such as image captioning and speech recognition. However, they remain susceptible to transient faults when deployed in environments with high-energy particles or radiation. It remains unknown how the potential transient faults will impact LSTM models. Therefore, we investigate the resilience of the weights and biases of these networks through four implementations of the original LSTM network. Based on the observations made through the fault injection of these networks, we propose an effective method of fault mitigation through Hamming encoding of selected weights and biases in a given network.