IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat

Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang

Abstract: This paper presents key ideas behind IEA-Plot, a software framework designed to conduct test data analytics through chat. We use wafer-based data analytics as an application example to discuss the ideas. IEA-plot interacts with a user through a dialog and produces plots according to user instructions. At the core of IEA-Plot is a knowledge graph connecting a frontend natural language parser to a backend API. This knowledge graph captures our analytics knowledge in the specific context. Usage examples are presented based on test data collected from a recent production line.