Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics

Shuai Yang, ZhiFei Chen, Pengguang Chen, Xi Fang, Shu Liu, Ying-Cong Chen

Primary Area: datasets and benchmarks

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Keywords: dataset

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Abstract:

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack the precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image.
Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models.
Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

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Submission Number: 1079