Evaluating conventional and deep learning segmentation for fast X-ray CT porosity measurements of polymer laser sintered AM parts

Simon Bellens, Gabriel M. Probst, Michel Janssens, Patrick Vandewalle, Wim Dewulf

Abstract: Highlights•Evaluation of the image quality for a broad range of fast XCT acquisitions.•Segmentation of low-quality XCT scans using deep learning segmentation.•Generalization capabilities of the deep learning segmentation well suited for automated quality inspection.

External IDs:doi:10.1016/j.polymertesting.2022.107540