Diversity Algorithms for Laser Fault Injection

Marina Krcek, Thomas Ordas

Abstract: Before third-party evaluation and certification, manufacturers often conduct internal security evaluations on secure hardware devices, including fault injection (FI). Within this process, FI aims to identify parameter combinations that reveal device vulnerabilities. The impracticality of conducting an exhaustive search over FI parameters has prompted the development of advanced and guided algorithms. However, these proposed methods often focus on a specific, critical region, which is beneficial for attack scenarios requiring a single optimal FI parameter combination.