A Generalized Semiconductor Wafer Defect Classifier

Priyanshu Kumar Rai, Pratik Pal, Akshay Agarwal

Keywords: Silicon Wafer Defects, Generalized Defect Classification

TL;DR: Proposed a cost effective and generalized wafer defect detection algorithm

Abstract: Silicon-based integrated circuits (ICs) and electronic devices are used in every possible electronic device, including high-performance computers fabricated from silicon wafers. Hence, ensuring the quality and reliability of silicon components is of utmost importance. This work focuses on developing and implementing computer vision and deep learning algorithms to detect defects in semiconductor manufacturing ICs, contributing to higher yields and reduced production costs.

Submission Number: 45