SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis

Open Webpage

Jing Jie Tan, Rupert Schreiner, Matthias Hausladen, Ali Asgharzade, Simon Edler, Julian Bartsch, Michael Bachmann, Andreas Schels, Ban-Hoe Kwan, Danny Wee-Kiat Ng, Yan Chai Hum

Published: 2026, Last Modified: 28 May 2026CoRR 2026EveryoneRevisionsBibTeXCC BY-SA 4.0