Interpretable CNN-Based Lithographic Hotspot Detection Through Error Marker Learning

Haoyang Sun, Cong Jiang, Xun Ye, Dan Feng, Benjamin Tan, Yuzhe Ma, Kang Liu

Abstract: As the technology node develops toward its physical limit, lithographic hotspot detection has become increasingly important and ever-challenging in the computer-aided design (CAD) flow. In recent years, convolutional neural networks (CNNs) have achieved great success in hotspot detection. However, the interpretability of their hotspot prediction has yet to be considered. Compared with conventional lithography simulation and pattern matching-based methods, the black-box nature of CNNs wavers their practical applications with confidence. In this article, we propose the first interpretable CNN-based hotspot detector capable of providing high-detection accuracy and reliable explanations for hotspot identification. Specifically, we augment the training dataset with expanded error markers obtained and preprocessed from lithography simulation, which are then learned by an encoder-decoder architecture as intermediate features. We additionally introduce coordinate attention in the encoder to facilitate better-feature extraction. By learning these error markers and part of their surrounding metals as root cause hotspot features, our architecture achieves the highest-hotspot accuracy of 99.78% and the lowest-false positive rate of 5.29% compared to all prior work. Moreover, our method demonstrates the best visual and quantitative interpretability results when applying CNN interpretation methods.