Training image classifiers using Semi-Weak Label Data

Ankit Parag Shah, Bhiksha Raj

Abstract: This paper introduces a new semi-weak label learning paradigm which provides additional information in comparison to the weak label classification. We define semi-weak label data as data where we know the presence or absence of a given class and additionally we have the information about the exact count of each class as opposed to knowing the label proportions. A three-stage framework is proposed to address the problem of learning from semi-weak labels. It leverages the fact that counting information is naturally non-negative and discrete. Experiments are conducted on generated samples from CIFAR-10 and we compare our model with a fully-supervised setting baseline, a weakly-supervised setting baseline and a learning from proportion(LLP) baseline. Our framework not only outperforms both baseline models for MIL-based weakly supervised setting and learning from proportion setting, but also gives comparable results compared to the fully supervised model. Further, we conduct thorough ablation studies to analyze across datasets and variation with batch size, losses architectural changes, bag size and regularization, thereby demonstrating robustness of our approach.

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