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Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition
Zichang Tan
,
Ajian Liu
,
Jun Wan
,
Hao Li
,
Zhen Lei
,
Guodong Guo
,
Stan Z. Li
2022 (modified: 11 Nov 2022)
IEEE Trans. Image Process. 2022
Readers:
Everyone
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