On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model

Bernhard Bauer, Mouadh Ayache, Saleh Mulhem, Meirav Nitzan, Jyotika Athavale, Rainer Buchty, Mladen Berekovic

Abstract: How to understand the dependability concerning electrical/electronic (E/E) product development? We introduce an essential answer that can be perceived as the first step toward a novel approach for dependable E/E product development, called the dual-cone V-model.