Low-power weighted pseudo-random BIST using special scan cells

Shalini Ghosh, Eric W. MacDonald, Sugato Basu, Nur A. Touba

Abstract: In this paper, a technique for weighted pseudo-random built-in self-test (BIST) of VLSI circuits is proposed, which uses special scan cells and a new weight selection algorithm to achieve low power dissipation. It is based on weighted pseudo-random scan testing in which only 3 weight values are used - 2 fixed values (0 or 1) and 1 random value (0.5). A new weight selection algorithm is used to select a set of weights that achieves high fault coverage while reducing power. The idea is to minimize power by careful selection of the set of scan cells having fixed values (0 or 1) in order to reduce switching activity. To implement this in hardware, a new scan cell design is proposed that can do scan and capture in the normal mode as well as fixed-bit mode. The new scan cell hardware increases the area of a typical circuit by less than 4%, but reduces power by as much as 96%, as indicated in experiments performed on benchmark circuits.