Automated Particle Picking in Cryo-Electron Micrographs using Deep Regression

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Nguyen P. Nguyen, Ilker Ersoy, Tommi A. White, Filiz Bunyak

Published: 01 Jan 2018, Last Modified: 18 Feb 2025BIBM 2018EveryoneRevisionsBibTeXCC BY-SA 4.0