Accurate method for identical fault search in logical circuits

Alexander L. Stempkovskiy, Dmitry V. Telpukhov, Roman A. Solovyev

Abstract: The problems of IC reliability are now becoming increasingly important. The idea of reliability is a complex integrated concept and includes structural, schematic and technological solutions, as well as solutions at the level of logic gates, register transmissions and microsystem as a whole. This paper is devoted to preprocessing of logical circuits aimed at the reduction of computational costs of evaluating fault tolerance parameters, as well as the costs of circuit verification and testing. A method for identical fault search in logical circuits have been proposed, which makes it possible to estimate the effect of only one fault from the corresponding equivalence class of identical faults in subsequent verification and evaluation processes. In addition, these data can be used to construct self-test circuits.