Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications

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Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy

Published: 01 Jan 2013, Last Modified: 15 May 2025Microelectron. Reliab. 2013EveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Highlights•We evaluate smart power converters life time under extreme tests conditions.•Dissipated energy during each test (short circuit, avalanche) is the same.•Repetitive short circuit is the most constraining mode even with same energy.•Increasing current during short circuit probably induce high thermal constraints.•Dissipated energy is not the only parameter influencing the life time.