A data generation method with dual discriminators and regularization for surface defect detection under limited data

Open Webpage

Boheng Liu, Tianrui Zhang, Yao Yu, Ligang Miao

Published: 2023, Last Modified: 04 Nov 2025Comput. Ind. 2023EveryoneRevisionsBibTeXCC BY-SA 4.0
Abstract: Highlights•Collecting surface defect images in industry presents significant challenges.•Limited defect data severely hampers the performance of defect detection models.•Our method can prevent GAN training crashes in situations where data is scarce.•Our novel data generation method produces high-quality and diverse defect images.•Our method enhances defect detection models’ performance in data-limited scenarios.